Effect of ion beam mixing on microstructure and magnetic properties of Gd-Co multilayer films

Journal of Applied Physics

Volumn 79, Issue 8 PART 2B, 1996, Pages 6306-6308

  Choe, G ^a,b   Walser, R M ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b Materials Research Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004335271     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362046     Document Type: Article

References (8)

1. (A representative set of references include) M. Van Rossum, M-A. Nicolet, and C. M. Wilts, J. Appl. Phys. 56, 1032 (1984); G. Suran, R. Krishnan, M. Tessier, and P. Gerard, IEEE Trans. Magn. 20, 1423 (1984); L. Smardz, J. Baszynski, and B. Rauschenbach, Thin Solid Films 175, 295 (1989); Y. Kido, M. Tada, J. Mater. Res. 4, 1151 (1989); M. Kopcewicz and D. L. Williamson, J. Appl. Phys. 74, 4363 (1993); Z. J. Zhang and B. X. Liu, J. Phys. Conders. Mater. 6, 2647 (1994).
2. (A representative set of references include) M. Van Rossum, M-A. Nicolet, and C. M. Wilts, J. Appl. Phys. 56, 1032 (1984); G. Suran, R. Krishnan, M. Tessier, and P. Gerard, IEEE Trans. Magn. 20, 1423 (1984); L. Smardz, J. Baszynski, and B. Rauschenbach, Thin Solid Films 175, 295 (1989); Y. Kido, M. Tada, J. Mater. Res. 4, 1151 (1989); M. Kopcewicz and D. L. Williamson, J. Appl. Phys. 74, 4363 (1993); Z. J. Zhang and B. X. Liu, J. Phys. Conders. Mater. 6, 2647 (1994).
3. (A representative set of references include) M. Van Rossum, M-A. Nicolet, and C. M. Wilts, J. Appl. Phys. 56, 1032 (1984); G. Suran, R. Krishnan, M. Tessier, and P. Gerard, IEEE Trans. Magn. 20, 1423 (1984); L. Smardz, J. Baszynski, and B. Rauschenbach, Thin Solid Films 175, 295 (1989); Y. Kido, M. Tada, J. Mater. Res. 4, 1151 (1989); M. Kopcewicz and D. L. Williamson, J. Appl. Phys. 74, 4363 (1993); Z. J. Zhang and B. X. Liu, J. Phys. Conders. Mater. 6, 2647 (1994).
4. (A representative set of references include) M. Van Rossum, M-A. Nicolet, and C. M. Wilts, J. Appl. Phys. 56, 1032 (1984); G. Suran, R. Krishnan, M. Tessier, and P. Gerard, IEEE Trans. Magn. 20, 1423 (1984); L. Smardz, J. Baszynski, and B. Rauschenbach, Thin Solid Films 175, 295 (1989); Y. Kido, M. Tada, J. Mater. Res. 4, 1151 (1989); M. Kopcewicz and D. L. Williamson, J. Appl. Phys. 74, 4363 (1993); Z. J. Zhang and B. X. Liu, J. Phys. Conders. Mater. 6, 2647 (1994).
5. (A representative set of references include) M. Van Rossum, M-A. Nicolet, and C. M. Wilts, J. Appl. Phys. 56, 1032 (1984); G. Suran, R. Krishnan, M. Tessier, and P. Gerard, IEEE Trans. Magn. 20, 1423 (1984); L. Smardz, J. Baszynski, and B. Rauschenbach, Thin Solid Films 175, 295 (1989); Y. Kido, M. Tada, J. Mater. Res. 4, 1151 (1989); M. Kopcewicz and D. L. Williamson, J. Appl. Phys. 74, 4363 (1993); Z. J. Zhang and B. X. Liu, J. Phys. Conders. Mater. 6, 2647 (1994).
6. (A representative set of references include) M. Van Rossum, M-A. Nicolet, and C. M. Wilts, J. Appl. Phys. 56, 1032 (1984); G. Suran, R. Krishnan, M. Tessier, and P. Gerard, IEEE Trans. Magn. 20, 1423 (1984); L. Smardz, J. Baszynski, and B. Rauschenbach, Thin Solid Films 175, 295 (1989); Y. Kido, M. Tada, J. Mater. Res. 4, 1151 (1989); M. Kopcewicz and D. L. Williamson, J. Appl. Phys. 74, 4363 (1993); Z. J. Zhang and B. X. Liu, J. Phys. Conders. Mater. 6, 2647 (1994).
7. G. Choe and R. M. Walser, J. Appl. Phys. 73, 6010 (1993).
8. B. E. Warren, X-ray Diffraction (Addison-Wesley, Reading, MA, 1969).