Current-induced defect conductivity in hydrogenated silicon-rich amorphous silicon nitride

Philosophical Magazine Letters

Volumn 72, Issue 5, 1995, Pages 323-329

  Shannon, J M ^a   Annis, A D ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004258803     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/09500839508242470     Document Type: Article

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