Method for measuring the rf modulation characteristics of Mach-Zehnder-type modulators

Applied Physics Letters

Volumn 36, Issue 8, 1980, Pages 626-629

  Auracher, F ^a   Keil, R ^a  

^a SIEMENS AG   (Germany)

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Indexed keywords

EID: 0004247624     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.91630     Document Type: Article

References (9)