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Volumn 54, Issue 10, 1998, Pages 1489-1491

Bis(diisopropylammonium) hexafluorosilicate(IV)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0004208801     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S010827019800609X     Document Type: Article
Times cited : (32)

References (16)
  • 11
    • 18444384944 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1992). SHELXTL-Plus. Release 4.22. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1992) SHELXTL-Plus. Release 4.22
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.