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Volumn 49, Issue 3, 1998, Pages 161-168
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Microscopic properties of passive films on Ti and Zr from optical, electrochemical and SXM-measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0004168361
PISSN: 09475117
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-4176(199803)49:3<161::AID-MACO161>3.0.CO;2-P Document Type: Article |
Times cited : (10)
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References (16)
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