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Volumn 35, Issue 28, 1996, Pages 5626-5629

In situ monitoring of film deposition with an ellipsometer based on a four-detector photopolarimeter

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EID: 0004059426     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.005626     Document Type: Article
Times cited : (14)

References (17)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.