Structural defects: General approach and application to textile inspection

Proceedings - International Conference on Pattern Recognition

Volumn 15, Issue 1, 2000, Pages 521-523

  Chetverikov, Dmitry ^a  

^a INSTITUTE FOR COMPUTER SCIENCE AND CONTROL   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; STATISTICS; TEXTILES;

DEFECT-FREE; FEATURE SPACE; PRIOR KNOWLEDGE; REGULAR STRUCTURE; ROBUST DETECTION; STRUCTURAL DEFECT; TEXTILE INSPECTION; TEXTURE PATTERNS;

PATTERN RECOGNITION;

EID: 0004045930     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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