Resistivity, charge diffusion, and charge depth determinations on charged insulator surfaces

Journal of Applied Physics

Volumn 80, Issue 11, 1996, Pages 6336-6339

  Liesegang, J ^a   Senn, B C ^a  

^a LA TROBE UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003994936     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363651     Document Type: Article

References (10)

1. D. A. Seanor, in Polymer Science (North-Holland, Amsterdam, 1972), Chap. 17.
2. D. K. Das-Gupta, IEEE Trans. Elect. Insul. 27, 909 (1992).
3. A. R. Blyth, Electrical Properties of Polymers (Cambridge University Press, Cambridge, 1980).
4. J. Liesegang, B. C. Senn, and E. R. Smith, J. Appl. Phys. 77, 5782 (1995).
5. Annual Book of ASTM Standards, Standard Test Method for Electrostatic Charge (ANSI/ASTM, New York, 1978), Vol. D2679-73; Standard Test Method for Static Electrification (ASTM, New York, 1992), Vol. D4470-92.
6. Annual Book of ASTM Standards, Standard Test Method for Electrostatic Charge (ANSI/ASTM, New York, 1978), Vol. D2679-73; Standard Test Method for Static Electrification (ASTM, New York, 1992), Vol. D4470-92.
7. N. F. Mott and R, W. Gurney Electronic Processes in ionic crystals (Oxford University Press, Oxford, 1948).
8. R. L. Street, "Numerical Finite Difference Methods," in The Analysis and Solution of Partial Differential Equations (Brooks/Cole, New York, 1973), Chap. 10.
9. B. Carnahan, H. A. Luther, and J. O. Wilkes, in Applied Numerical Methods (Wiley, New York, 1969), Chap. 7.
10. B. F. Plybon An Introduction to Applied Numerical Analysis (PWS-KENT, Boston, 1992), pp. 366.