Recoil spectrometry of thin film reactions in the Pd/InP system

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 4, 1996, Pages 2405-2413

  Persson, Leif ^a,f   Bouanani, Mohamed El ^a   Hult, Mikael ^a,f   Jönsson, Patrik ^a   Whitlow, Harry J ^a   Andersson, Margaretha ^b   Georgsson, Kristina ^a   Bubb, Ian F ^c   Johnston, Peter N ^c   Walker, Scott R ^c   Cohen, David D ^d   Dytlewski, Nick ^d   Zaring, Carina ^e,g   Östling, Mikael ^e  

^a LUND INSTITUTE OF TECHNOLOGY   (Sweden)

^b UPPSALA UNIVERSITY   (Sweden)

^c RMIT UNIVERSITY   (Australia)

^d AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^e ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^f JOINT RESEARCH CENTRE   (Italy)

^g ERICSSON RADIO SYSTEMS AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003988362     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580028     Document Type: Article

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