-
1
-
-
0018515929
-
Fault analysis and test generation for Programmable Logic Array (PLA)
-
September
-
D. L. Ostapko and S. J. Hong, "Fault Analysis and Test Generation for Programmable Logic Array (PLA)", IEEE Trans. on Computers, Vol. C-28, No. 9, pp. 617-627, September 1979.
-
(1979)
IEEE Trans. on Computers
, vol.C-28
, Issue.9
, pp. 617-627
-
-
Ostapko, D.L.1
Hong, S.J.2
-
2
-
-
0020748515
-
An on-line algorithm for the location of cross point faults in programmable logic arrays
-
May
-
K. S. Ramanatha and N. N. Biswas, "An On-Line Algorithm for the Location of Cross Point Faults in Programmable Logic Arrays", IEEE Trans. on Computers, Vol. C-32, No. 5, pp. 438-444, May 1983.
-
(1983)
IEEE Trans. on Computers
, vol.C-32
, Issue.5
, pp. 438-444
-
-
Ramanatha, K.S.1
Biswas, N.N.2
-
3
-
-
0018546155
-
Detection of faults in programmable logic arrays
-
November
-
J. E. Smith, "Detection of Faults in Programmable Logic Arrays", IEEE Trans. on Computers, Vol. C-28, No. 11, pp. 845-853, November 1979.
-
(1979)
IEEE Trans. on Computers
, vol.C-28
, Issue.11
, pp. 845-853
-
-
Smith, J.E.1
-
4
-
-
0019634514
-
A design of programmable logic array with universal tests
-
November
-
H. Fujiwara and K. Kinoshita, "A Design of Programmable Logic Array with Universal Tests", IEEE Trans. on Computers, Vol. C-30, No. 11, pp. 823-829, November 1981.
-
(1981)
IEEE Trans. on Computers
, vol.C-30
, Issue.11
, pp. 823-829
-
-
Fujiwara, H.1
Kinoshita, K.2
-
5
-
-
0019634613
-
A hardware approach to self-testing of large programmable logic arrays
-
November
-
W. Daehn and J. Mucha, "A Hardware Approach to Self-Testing of Large Programmable Logic Arrays", IEEE Trans. on Computers, Vol. C-30, No. 11, pp. 829-833, November 1981.
-
(1981)
IEEE Trans. on Computers
, vol.C-30
, Issue.11
, pp. 829-833
-
-
Daehn, W.1
Mucha, J.2
-
6
-
-
0022044545
-
Implementing a built-in self-test PLA design
-
April
-
R. Treuer, H. Fujiwara, and V. K. Agarwal", Implementing a Built-In Self-Test PLA Design", IEEE Design and Test, pp. 37-48, April 1985.
-
(1985)
IEEE Design and Test
, pp. 37-48
-
-
Treuer, R.1
Fujiwara, H.2
Agarwal, V.K.3
-
10
-
-
84949860610
-
-
"PLA and FPGA Devices", http://www.elec.uq.oz.au/~e3390/lectures/lect14/sld002.htm, 1998.
-
(1998)
PLA and FPGA Devices
-
-
-
15
-
-
0020290502
-
A new fault model and testing technique for CMOS devices
-
November
-
Y. K. Malaiya, "A New Fault Model and Testing Technique for CMOS Devices", 1982 International Test Conference, PP. 25-34, November 1982.
-
(1982)
1982 International Test Conference
, pp. 25-34
-
-
Malaiya, Y.K.1
-
17
-
-
0020278451
-
Simple and efficient algorithms for functional RAM testing
-
November
-
M. Marinescu, "Simple and Efficient Algorithms for Functional RAM Testing", 1982 International Test Conference, pp. 236-239, November 1982.
-
(1982)
1982 International Test Conference
, pp. 236-239
-
-
Marinescu, M.1
-
18
-
-
0017982899
-
Efficient algorithms for testing semiconductor random-access memories
-
June
-
R. Nair, S. M. Thatte, and J. A. Abraham, "Efficient Algorithms for Testing Semiconductor Random-Access Memories", IEEE Trans. on Computers, Vol. C-27, No. 6, pp. 572-576, June 1978.
-
(1978)
IEEE Trans. on Computers
, vol.C-27
, Issue.6
, pp. 572-576
-
-
Nair, R.1
Thatte, S.M.2
Abraham, J.A.3
-
19
-
-
0020255920
-
Quality control for production testing
-
November
-
F. G. Cockerill, "Quality Control for Production Testing", 1982 International Test Conference, pp. 308-314, November 1982.
-
(1982)
1982 International Test Conference
, pp. 308-314
-
-
Cockerill, F.G.1
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