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Volumn 2000-January, Issue , 2000, Pages 183-193

Self-repairable EPLDs: Design, self-repair, and evaluation methodology

Author keywords

[No Author keywords available]

Indexed keywords

HARDWARE; LOGIC DEVICES; NASA; REPAIR;

EID: 0003985372     PISSN: 15506029     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EH.2000.869356     Document Type: Conference Paper
Times cited : (3)

References (20)
  • 1
    • 0018515929 scopus 로고
    • Fault analysis and test generation for Programmable Logic Array (PLA)
    • September
    • D. L. Ostapko and S. J. Hong, "Fault Analysis and Test Generation for Programmable Logic Array (PLA)", IEEE Trans. on Computers, Vol. C-28, No. 9, pp. 617-627, September 1979.
    • (1979) IEEE Trans. on Computers , vol.C-28 , Issue.9 , pp. 617-627
    • Ostapko, D.L.1    Hong, S.J.2
  • 2
    • 0020748515 scopus 로고
    • An on-line algorithm for the location of cross point faults in programmable logic arrays
    • May
    • K. S. Ramanatha and N. N. Biswas, "An On-Line Algorithm for the Location of Cross Point Faults in Programmable Logic Arrays", IEEE Trans. on Computers, Vol. C-32, No. 5, pp. 438-444, May 1983.
    • (1983) IEEE Trans. on Computers , vol.C-32 , Issue.5 , pp. 438-444
    • Ramanatha, K.S.1    Biswas, N.N.2
  • 3
    • 0018546155 scopus 로고
    • Detection of faults in programmable logic arrays
    • November
    • J. E. Smith, "Detection of Faults in Programmable Logic Arrays", IEEE Trans. on Computers, Vol. C-28, No. 11, pp. 845-853, November 1979.
    • (1979) IEEE Trans. on Computers , vol.C-28 , Issue.11 , pp. 845-853
    • Smith, J.E.1
  • 4
    • 0019634514 scopus 로고
    • A design of programmable logic array with universal tests
    • November
    • H. Fujiwara and K. Kinoshita, "A Design of Programmable Logic Array with Universal Tests", IEEE Trans. on Computers, Vol. C-30, No. 11, pp. 823-829, November 1981.
    • (1981) IEEE Trans. on Computers , vol.C-30 , Issue.11 , pp. 823-829
    • Fujiwara, H.1    Kinoshita, K.2
  • 5
    • 0019634613 scopus 로고
    • A hardware approach to self-testing of large programmable logic arrays
    • November
    • W. Daehn and J. Mucha, "A Hardware Approach to Self-Testing of Large Programmable Logic Arrays", IEEE Trans. on Computers, Vol. C-30, No. 11, pp. 829-833, November 1981.
    • (1981) IEEE Trans. on Computers , vol.C-30 , Issue.11 , pp. 829-833
    • Daehn, W.1    Mucha, J.2
  • 10
    • 84949860610 scopus 로고    scopus 로고
    • "PLA and FPGA Devices", http://www.elec.uq.oz.au/~e3390/lectures/lect14/sld002.htm, 1998.
    • (1998) PLA and FPGA Devices
  • 15
    • 0020290502 scopus 로고
    • A new fault model and testing technique for CMOS devices
    • November
    • Y. K. Malaiya, "A New Fault Model and Testing Technique for CMOS Devices", 1982 International Test Conference, PP. 25-34, November 1982.
    • (1982) 1982 International Test Conference , pp. 25-34
    • Malaiya, Y.K.1
  • 17
    • 0020278451 scopus 로고
    • Simple and efficient algorithms for functional RAM testing
    • November
    • M. Marinescu, "Simple and Efficient Algorithms for Functional RAM Testing", 1982 International Test Conference, pp. 236-239, November 1982.
    • (1982) 1982 International Test Conference , pp. 236-239
    • Marinescu, M.1
  • 18
    • 0017982899 scopus 로고
    • Efficient algorithms for testing semiconductor random-access memories
    • June
    • R. Nair, S. M. Thatte, and J. A. Abraham, "Efficient Algorithms for Testing Semiconductor Random-Access Memories", IEEE Trans. on Computers, Vol. C-27, No. 6, pp. 572-576, June 1978.
    • (1978) IEEE Trans. on Computers , vol.C-27 , Issue.6 , pp. 572-576
    • Nair, R.1    Thatte, S.M.2    Abraham, J.A.3
  • 19
    • 0020255920 scopus 로고
    • Quality control for production testing
    • November
    • F. G. Cockerill, "Quality Control for Production Testing", 1982 International Test Conference, pp. 308-314, November 1982.
    • (1982) 1982 International Test Conference , pp. 308-314
    • Cockerill, F.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.