Combining RF functional testing and in-circuit test systems

44th ARFTG Conference Digest - Fall 1994

Volumn , Issue , 1994, Pages 112-116

  Talen, Gerald ^a   Peirce, Steve ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; ELECTRIC SIGNAL SYSTEMS; INDIUM COMPOUNDS; MIXED SIGNAL INTEGRATED CIRCUITS; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; PROBES; TEST FACILITIES; TIMING CIRCUITS;

ASSEMBLY OPERATIONS; BOUNDARY SCAN; DIGITAL CIRCUIT BOARDS; FUNCTIONAL TESTING; IN-CIRCUIT TEST SYSTEMS; IN-CIRCUIT TESTS; MIXED-SIGNAL CIRCUITS; NUMBER OF SOURCES;

ELECTRIC NETWORK ANALYSIS;

EID: 0003984803     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1994.327088     Document Type: Conference Paper

References (1)

1. “A 3Ghz 50 Ohm probe for PCB Measurements”, by Joel Dunsmore, Hewlett Packard, Robert Kornow&i, Motorola, and Chuck Tygar4 Everett Charles Technologies, Inc. Paper presented at the RF Expo East,Tampa Convention Center, Oct. 19-21, 1993.