Ultrashort-pulse optical damage

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2714, Issue , 1996, Pages 616-629

  Stuart, Brent C ^a   Feit, Michael D ^a   Herman, Steve M ^a   Rubenchik, Alexander M ^a   Shore, Bruce W ^a   Perry, Michael D ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Dielectric breakdown; Diffraction gratings; Laser induced damage; Multiphoton ionization; Short pulse

Indexed keywords

AVALANCHES (SNOWSLIDES); DIELECTRIC MATERIALS; DIFFRACTION; DIFFRACTION GRATINGS; ELECTRIC BREAKDOWN; ELECTRIC FIELDS; IONIZATION; LASER DAMAGE; LASERS; MULTIPHOTON PROCESSES; OPTICAL MATERIALS; PHOTOIONIZATION; SNOW;

AVALANCHE IONIZATIONS; DAMAGE PROCESSES; DAMAGE THRESHOLDS; DIELECTRIC BREAKDOWN; DIELECTRIC MIRRORS; ELECTRIC FIELD STRENGTHS; EXCITED ELECTRONS; MULTIPHOTON; MULTIPHOTON IONIZATION; OPTICAL COMPONENTS; OPTICAL DAMAGES; PEAK POWERS; PULSE LASER SYSTEMS; PULSE WIDTHS; PURE DIELECTRICS; QUANTITATIVE AGREEMENTS; SHORT PULSES; SHORT-PULSE; THEORETICAL MODELING; THRESHOLD FLUENCE;

PULSED LASER APPLICATIONS;

EID: 0003880211     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.240404     Document Type: Conference Paper

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