Physical dependence of the sensitivity and room-temperature stability of AuxGe1-x thin film resistive thermometers on annealing conditions

Review of Scientific Instruments

Volumn 69, Issue 1, 1998, Pages 133-138

  Fortune, Nathanael A ^a   Graf, Michael J ^b   Murata, Keizo ^c  

^a SMITH COLLEGE   (United States)

^b BOSTON COLLEGE   (United States)

^c Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003877748     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148488     Document Type: Article

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