Direct determination of the Andreev reflection probability by means of point contact spectroscopy

Applied Physics Letters

Volumn 76, Issue 9, 2000, Pages 1152-1154

  Jakob, M ^a   Stahl, H ^a   Knoch, J ^a   Appenzeller, J ^a   Lengeler, B ^a   Hardtdegen, H ^b   Luth H ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003789808     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125967     Document Type: Article

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