Characterization of the temperature dependent phase transition of evaporated Ti films on diamond: Phase identification using maximum entropy data analysis

Journal of Applied Physics

Volumn 82, Issue 7, 1997, Pages 3314-3320

  Miller, S ^a   Fischer, R ^a   Plank, H ^a   Roth, J ^a   Dose, V ^a  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003758916     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365640     Document Type: Article

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