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Journal of Applied Physics

Volumn 75, Issue 10, 1994, Pages 5087-5094

A Monte Carlo study of hot electron injection and interface state generation model for silicon metal-oxide-semiconductor field-effect transistors

(3) Ellis Monaghan, John J a Kim, K W a Littlejohn, Michael A a

a NORTH CAROLINA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003719761 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.355752 Document Type: Article

Times cited : (9)

References (33)

1
- 0019476903
- (1981) IEEE Trans. Electron Devices , vol.28 , pp. 83
- Fair, R.B.¹ Sun, R.C.²

2
- 0022028660
- (1985) IEEE Trans. Electron Devices , vol.32 , pp. 691
- Hofmann, K.R.¹ Werner, C.² Weber, W.³ Dorda, B.⁴

3
- 0024125256
- (1988) IEEE Trans. Electron Devices , vol.35 , pp. 2221
- Ancona, M.G.¹ Saks, N.S.² McCarthy, D.³

4
- 0026122995
- (1991) IEEE Trans. Electron Devices , vol.38 , pp. 512
- Hänsch, W.¹ Mazure, C.² Lill, A.³ Orlowski, M.⁴

5
- 0024125950
- (1988) IEEE Trans. Electron Devices , vol.35 , pp. 2229
- Roblin, P.¹ Summan, A.² Bibyk, S.³

6
- 0017449653
- (1987) J. Appl. Phys , vol.48 , pp. 286
- Ning, T.H.¹ Osburn, C.M.² Yu, H.N.³

7
- 30244468419
- (Kluwer, Boston)
- (1991) Computational Electronics: Semiconductor Transport and Device Simulation , pp. 3-13
- Pinto, M.R.¹ Hess, K.² Leburton, J.P.³ Ravaioli, U.⁴ Coughran, W.M.⁵ Rafferty, C.S.⁶ Smith, R.K.⁷ Sangiorgi, E.⁸

8
- 11744285604
- (1989) J. Appl. Phys , vol.66 , pp. 1435
- Hänsch, W.¹ Schwerin, A.v.²

9
- 0027611039
- (1993) Solid-State Electron , vol.36 , pp. 833
- Wang, S.-L.¹ Goldsman, N.² Lin, Q.³ Frey, J.⁴

10
- 84939696523
- (1988) IEEE Electron Device Lett , vol.9 , pp. 13
- Sangiorgi, E.¹ Pinto, M.R.² Venturi, F.³ Fichtner, W.⁴

11
- 0024755019
- (1989) Appl. Surf. Sci , vol.39 , pp. 578
- Fischetti, M.V.¹ Laux, S.E.² DiMaria, D.J.³

12
- 0043141583
- (1991) J. Appl. Phys , vol.69 , pp. 3986
- Nishida, T.¹ Thompson, S.E.²

13
- 21544467967
- (1989) J. Appl. Phys , vol.65 , pp. 2342
- DiMaria, D.J.¹ Stasiak, J.W.²

14
- 0024750360
- (1989) Appl. Surf. Sci , vol.39 , pp. 327
- Heyns, M.M.¹ Krishna Rao, D.² De Keersmaecker, R.F.³

15
- 36549092971
- (1990) J. Appl. Phys , vol.67 , pp. 7439
- Buchanan, D.A.¹ DiMaria, D.J.²

16
- 0004235740
- 2nd ed. (Clarendon, Oxford)
- (1988) Quantum Processes in Semiconductors
- Ridley, B.K.¹

17
- 35949025517
- (1983) Rev. Mod. Phys , vol.55 , pp. 645
- Jacoboni, C.¹ Reggiani, L.²

18
- 0343157554
- (1985) J. Appl. Phys , vol.57 , pp. 5336
- Wang, T.¹ Hess, K.²

19
- 0020826266
- (1983) J. Appl. Phys , vol.54 , pp. 5139
- Tang, J.Y.¹ Hess, K.²

20
- 0020826364
- (1983) J. Appl. Phys , pp. 5145
- Tang, J.Y.¹ Hess, K.²

21
- 35949009958
- (1988) Phys. Rev. B , vol.38 , pp. 9721
- Fischetti, M.V.¹ Laux, S.E.²

22
- 0004461440
- (1977) Appl. Phys. Lett , vol.30 , pp. 528
- Phillips, A.¹ Price, P.J.²

23
- 0026817615
- (1992) IEEE Trans. Electron Devices , vol.39 , pp. 356
- Sangiorgi, E.¹ Pinto, M.R.²

24
- 0008578423
- (1965) Sov. Phys. JETP , vol.21 , pp. 1135
- Keldysh, L.V.¹

25
- 0014778389
- (1970) Sloid-State Electron , vol.13 , pp. 583
- Van Overstaeten, R.¹ DeMan, H.²

26
- 0009667182
- (1966) Appl. Phys. Lett , vol.9 , pp. 242
- Crowell, C.R.¹ Sze, S.M.²

27
- 36149009998
- (1964) Phys. Rev , vol.134 , pp. 761
- Lee, C.A.¹ Logan, R.A.² Batdorf, R.L.³ Kleimack, J.J.⁴ Wiegmann, W.⁵

28
- 35949004966
- (1992) Phys. Rev. B , vol.45 , pp. 10958
- Bude, J.¹ Hess, K.² Iafrate, G.J.³

29
- 0024888510
- (1989) Solid-State Electron , vol.32 , pp. 1723
- Fischetti, M.V.¹ Laux, S.E.² Lee, W.³

30
- 0024878589
- (1989) Solid-State Electron , vol.32 , pp. 1579
- Yasuda, N.¹ Nakamura, H.² Taniguchi, K.³ Hamaguchi, C.⁴

31
- 0003164115
- (1985) Appl. Phys. Lett , vol.39 , pp. 58
- Lai, S.K.¹

32
- 0008780580
- (1986) IEEE Trans. Electron Devices , vol.33 , pp. 1529
- Saks, N.S.¹ Heremans, P.L.² Van Den Hove, L.³ Maes, H.E.⁴ De Keersmaecker, R.F.⁵ Declerck, G.J.⁶

33
- 0000515713
- (1990) J. Appl. Phys , vol.68 , pp. 5234
- DiMaria, D.J.¹

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