In-situ characterization of doping-effect on electronic structure of Epitaxial films of infinite layer SrCuO2

Czechoslovak Journal of Physics

Volumn 46, Issue SUPPL. 5, 1996, Pages 2683-2684

  Terada, N ^a   Iyo, A ^a   Sekita, Y ^a   Ishibashi, S ^a   Ihara, H ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003642189     PISSN: 00114626     EISSN: 15729486     Source Type: Journal    
DOI: 10.1007/BF02570328     Document Type: Article

References (5)

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3. M. G. Smith e tal., Nature 351 (1991) 549.
4. M. Takano et al., Physica C 176 (1991) 441.
5. C. H. Ahn et al., Science 269 (1995) 373.