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Volumn 14, Issue 2, 1996, Pages 738-743
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Investigation of low temperature SiO2 plasma enhanced chemical vapor deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0003639602
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.588707 Document Type: Article |
Times cited : (63)
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References (24)
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