Geometric distortion corrections for fiber-optic tapers in X-ray charge-coupled-device detectors

Journal of Applied Crystallography

Volumn 32, Issue 1, 1999, Pages 11-14

  Paciorek, W A ^a,b   Meyer, M ^a,c   Chapuis, G ^a  

^a UNIVERSITY OF LAUSANNE   (Switzerland)

^b GLOBAL PHASING LTD   (United Kingdom)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003616488     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898005172     Document Type: Article

References (9)

1. Akima, H. (1996). ACM Trans. Math. Soft. 22, 357-361.
2. Chao, M. C. & Boult, T. E. (1995). Technical Report CUCS-038-95, Department of Computer Science, Columbia University, New York, USA.
3. Hammersley, A. P., Svensson, S. O. & Thompson, A. (1994). Nucl. Instrum. Methods, A346, 312-321.
4. Hammersley, A. R, Svensson, S. O., Thompson, A., Graafsma, H., Kvick, Å. & Moy, J. P. (1995). Rev. Sci. Instrum. 66, 2729-2733.
5. Kinahan, P. E. & Karp, J. S. (1990). Nucl. Instrum. Methods, A299, 484-489.
6. Meyer, M., Paciorek, W. A., Kucharczyk, D. & Chapuis, G. (1999). In preparation.
7. Press, W., Teukolsky, S., Vetterling, W. & Flannery, B. (1992). Numerical Recipes in C. Cambridge University Press.
8. Stanton, M., Phillips, W., Li, Y. & Kalata, K. (1992). J. Appl. Cryst. 25, 549-558.
9. Thomas, D. J. (1989). Proc. R. Soc. London Ser. A, 425, 129-167.