Instability and reliability of silicon field emission array

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 3, 1996, Pages 1889-1894

  Li, Q ^a   Xu, J F ^a   Song, H B ^a   Liu, X F ^a   Kang, W P ^b  

^a EAST CHINA NORMAL UNIVERSITY   (China)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003538717     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588573     Document Type: Article

References (6)

1. R. F. Greene and K. Daneshvar, Proceedings of IVMC'94 (unpublished), p. 199.
2. R. Z. Bakhtizin et al., in Ref. 1, p. 203.
3. E. A. Adler, IEEE Trans. Electron Devices 38, 2304 (1991).
4. S. Meassiak et al., Proceedings of IYMC'93 (unpublished), p. 115.
5. W. J. Bintz and N. E. McGruer, in Ref. 4, p. 108.
6. H. Busta in Ref. 1, p. 70.