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Volumn 87, Issue 2, 1997, Pages 159-167
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The alignment of spectrometers and quantitative measurements in X-ray photoelectron spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0003370006
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/s0368-2048(97)00084-4 Document Type: Article |
Times cited : (7)
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References (23)
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