Sapphire filter thickness optimization in neutron scattering instruments

Review of Scientific Instruments

Volumn 71, Issue 1, 2000, Pages 70-73

  Stamatelatos, I E ^a   Messoloras, S ^a  

^a INSTITUTE OF NUCLEAR TECHNOLOGY AND RADIATION PROTECTION   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003308840     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150163     Document Type: Article

References (7)

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