Study of multilayer GaAs-InxGa1-xAs-layer-based structure by double-crystal x-ray diffractometry

Kristallografiya

Volumn 42, Issue 3, 1997, Pages 514-523

  Afanas'ev, A M ^a   Chuev, M A ^a   Imamov, R M ^a   Lomov, A A ^a   Mokerov, V G ^a   Fedorov, Yu V ^a   Guk, A V ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003221926     PISSN: 00234761     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (22)

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