Summary Abstract: Scanning tunneling microscopy and atomic force microscopy for microtribology

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 6, Issue 2, 1988, Pages 291-292

  Kaneko, R ^a   Nonaka, K ^a   Yasuda, K ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003177608     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.575428     Document Type: Article

References (3)

1. R. Kaneko, Jpn. Soc. Mech. Eng. Int. J. 30, 215 (1987).
2. A. Kohno and S. Hyodo, J. Phys. D 7,1243 (1974).
3. G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).