|
Volumn 87, Issue 9 III, 2000, Pages 5983-5985
|
Waveform control algorithm for rotational single sheet testers using system identification techniques
a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0003177487
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.372587 Document Type: Article |
Times cited : (7)
|
References (5)
|