Low thermal diffusivity measurements of thin films using mirage technique

Journal of Applied Physics

Volumn 84, Issue 12, 1998, Pages 6623-6627

  Wong, P K ^a,b   Fung, P C W ^a   Tam, H L ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003174343     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369036     Document Type: Article

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