Depth profiling analysis of thick Ni-and Co-doped oxide layers on Cr-based alloys of the interconnector of a solid oxide fuel cell using rf GDMS

Fresenius' Journal of Analytical Chemistry

Volumn 358, Issue 1-2, 1997, Pages 145-147

  Saprykin, A I ^b   Becker, J S ^a   Crone, U V D ^a   Dietze, H J ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b NIKOLAEV INSTITUTE OF INORGANIC CHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003173904     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050367     Document Type: Article

References (8)

1. Minh NQ (1993) J Amer Ceram Soc 76: 563-588
2. Gajewski W (1995) Die Brennstoffzelle - ein wiederentdecktes Prinzip der Stromerzeugung. Spektrum der Wissenschaft, pp 88-92
3. Crone U v d, Hänsel M, Quadakkers WJ, Vassen R (1997) Fresenius J Anal Chem 358 (this issue)
4. Nagai H, Fujikawa T, Shoji K (1983) Transactions of the Japan Institute of Metals 24: 581-588
5. Becker JS, Breuer U, Westheide J, Saprykin AI, Holzbrecher H, Nickel H, Dietze H-J (1996) Fresenius J Anal Chem 355: 626-632
6. Saprykin AI, Becker JS, Dietze H-J (1995) J Anal At Spectrom 10: 897-901
7. Jäger R, Becker JS, Dietze H-J, Broekaert JAC (1997) Fresenius J Anal Chem 358 (this issue)
8. Becker JS, Saprykin AI, Dietze H-J (1997) Intern J Mass Spectrom Ion Proc (in press)