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Applied Physics Letters

Volumn 39, Issue 1, 1981, Pages 58-60

Two-carrier nature of interface-state generation in hole trapping and radiation damage

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003164115 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.92514 Document Type: Article

Times cited : (153)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.