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Volumn 16, Issue 3, 1998, Pages 1178-1182

A numerical simulation of the evolution of nanometer-scale surface topography generated by ion milling

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0003160485     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581255     Document Type: Article
Times cited : (3)

References (15)
  • 7
    • 85034286266 scopus 로고
    • edited by J. J. Cuomo, S. M. Rossnagel, and H. K. Kaufman Noyes, New Jersey, Chap. 15
    • R. M. Bradley, in Handbook of Ion Beam Processing Technology, edited by J. J. Cuomo, S. M. Rossnagel, and H. K. Kaufman (Noyes, New Jersey, 1989), Chap. 15.
    • (1989) Handbook of Ion Beam Processing Technology
    • Bradley, R.M.1
  • 15
    • 85034308621 scopus 로고    scopus 로고
    • private communication
    • R. M. Bradley (private communication).
    • Bradley, R.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.