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Volumn 11, Issue 1, 1999, Pages 23-27

Enhanced sensitivity and selectivity of a gas chromatography-microwave-induced plasma atomic emission system (GC-MIP) at the 685.6-nm fluorine emission line

Author keywords

Atomic emission detection; Fluorine; Gas chromatography

Indexed keywords


EID: 0003144793     PISSN: 10407685     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1520-667x(1999)11:1<23::aid-mcs3>3.0.co;2-f     Document Type: Article
Times cited : (6)

References (21)
  • 19
    • 19944391533 scopus 로고
    • M.Sc. dissertation, UNICAMP
    • Augusto, F. M.Sc. dissertation, UNICAMP, 1990.
    • (1990)
    • Augusto, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.