Relative advantages of low temperature versus ambient temperature scanning electron microscopy in the study of mite morphology

International Journal of Acarology

Volumn 27, Issue 1, 2001, Pages 3-12

  Achor, Diann S ^a   Aguilar, Hugo ^a   Childers, Carl C ^a   Ochoa, Ronald ^b   Erbe, Eric F ^b   Wergin, William P ^b  

^a UNIVERSITY OF FLORIDA   (United States)

^b AGRICULTURAL RESEARCH SERVICE   (United States)

Author keywords

Acari; Low temperature scanning electron microscopy (LTSEM); Mites; Scanning electron microscopy (SEM); USA

Indexed keywords

EID: 0003116063     PISSN: 01647954     EISSN: None     Source Type: Journal    
DOI: 10.1080/01647950108684218     Document Type: Article

References (21)

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