An approach to modify and test expired window logic

Proceedings - 1st Asia-Pacific Conference on Quality Software, APAQS 2000

Volumn , Issue , 2000, Pages 99-108

  Tsai, W T ^a,c   Bai, Xiaoying ^a   Paul, R ^b   Devaraj, G ^a   Agarwal, V ^a  

^a AZ 85281   (United States)

^b ARMED FORCES INSTITUTE OF PATHOLOGY   (United States)

^c University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CENTURY YEAR PROBLEM;

REGRESSION TECHNIQUES; RIPPLE EFFECTS; SOFTWARE ELEMENTS; SOFTWARE MODIFICATION; TEST CASE GENERATION; TESTING TECHNIQUE; WINDOWING TECHNIQUES;

TESTING;

EID: 0003107364     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APAQ.2000.883783     Document Type: Conference Paper

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