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Volumn 133, Issue 1, 1992, Pages 61-72

Process integration of the ferroelectric memory fets (femfets) for ndro ferram

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0003070717     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150199208217977     Document Type: Article
Times cited : (51)

References (4)
  • 1
    • 0016091777 scopus 로고
    • A New Ferroelectric Memory Device: Metal-Ferroelectric-Semiconductor Transistor
    • S. Y. Wu, A New Ferroelectric Memory Device: Metal-Ferroelectric-Semiconductor Transistor,” IEEE Trans. Electron Devices, Vol. ED-21, p. 499 (1974)
    • (1974) IEEE Trans. Electron Devices , vol.ED-21 , pp. 499
    • Wu, S.Y.1
  • 4
    • 84963112044 scopus 로고
    • Influence of Orientation Effects on Polarization Switching in Bismuth Titanate and Barium Magnesium Fluoride Films
    • Monterey, Calif
    • M. H. Francombe, S. Sinharoy, H. Buhay, “Influence of Orientation Effects on Polarization Switching in Bismuth Titanate and Barium Magnesium Fluoride Films,” Fourth International Symposium on Integrated Ferroelectrics, March 1992, Monterey, Calif.
    • (1992) Fourth International Symposium on Integrated Ferroelectrics
    • Francombe, M.H.1    Sinharoy, S.2    Buhay, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.