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Applied Physics Letters

Volumn 42, Issue 10, 1983, Pages 890-892

Relation between current-voltage characteristics and interface states at metal-semiconductor interfaces

(2) Barret, C a Muret, P b

a UNIVERSITÉ PARIS SACLAY (France)

b CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003047719 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.93777 Document Type: Article

Times cited : (24)

References (14)

1
- 0000721816
- (1982) Appl. Phys. Lett , vol.41 , pp. 285
- Freeouf, J.L.¹

2
- 0016082017
- (1974) J. Appl. Phys , vol.45 , pp. 3079
- Deneuville, A.¹

3
- 0018486761
- (1979) J. Appl. Phys , vol.50 , pp. 4217
- Barret, C.¹ Vapaille, A.²

4
- 36149025707
- (1947) Phys. Rev , vol.71 , pp. 717
- Bardeen, J.¹

5
- 36849123485
- (1965) J. Appl. Phys , vol.36 , pp. 3212
- Cowley, A.M.¹ Sze, S.M.²

6
- 0020182911
- (1982) J. Appl. Phys , vol.53 , pp. 6300
- Muret, P.¹

7
- 0018021011
- (1978) Solid State Electron , vol.21 , pp. 1209
- Barret, C.¹ Vapaille, A.²

8
- 85083870102
- Proc. XVIth Int. Conf. Phys. Semicond., Montpellier (unpublished).
- (1982)
- Barret, C.¹ Chekir, F.² Nefatti, T.³ Vapaille, A.⁴ Massies, J.⁵

9
- 36749115700
- (1978) Appl. Phys. Lett , vol.32 , pp. 256
- Muret, P.¹ Deneuville, A.²

10
- 85083866749
- (unpublished).
- Barret, C.¹ Chekir, F.² Vapaille, A.³

11
- 0020183181
- (1982) J. Appl. Phys , vol.53 , pp. 6289
- Muret, P.¹ Deneuville, A.²

12
- 0000649660
- (1981) Appl. Phys. Lett , vol.39 , pp. 727
- Freeouf, J.L.¹ Woodall, J.M.²

13
- 85083868501
- (1975) C. R. Acad. Sc. Paris B , vol.780 , pp. 133
- Barret, C.¹ Le Bars, P.² Vapaille, A.³

14
- 0020163770
- (1982) J. Vac. Sci. Technol , vol.21 , pp. 570
- Freeouf, J.L.¹ Jackson, T.N.² Laux, S.E.³ Woodall, J.M.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.