The effects of processing conditions on PbGeTe film performances

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3175, Issue , 1998, Pages 429-432

  Zhang, Suying ^a   Cheng, Chiping ^a,d   Ling, Jiehua ^a,d   Fan, Bin ^a   Zou, Ziying ^b   Wang, Zhiyun ^b   Zhang, Jiajian ^b   Shi, Tiansheng ^c   Wang, Geya ^c  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^b National Certer For Testing Technology   (China)

^c SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

^d Shanghai Nicera Sensor Co Ltd   (China)

Author keywords

Multilayer; PbGeTe ZnS; PbTe ZnS; Refractive index; Single layer

Indexed keywords

ADHESION; FILM GROWTH; FILM PREPARATION; GERMANIUM; IMAGE ANALYSIS; LIGHT REFRACTION; MULTILAYERS; OPTICAL PROPERTIES; OXIDE FILMS; REFRACTIVE INDEX; REFRACTOMETERS; SILICON; SILICON WAFERS; SUBSTRATES; THICK FILMS; THIN FILM DEVICES; THIN FILMS; ZINC SULFIDE;

ADHESIVE STRENGTHS; FILM PERFORMANCES; OXIDE LAYERS; PARTICLE STRUCTURES; PBGETE/ZNS; PBTE/ZNS; PREFERRED ORIENTATIONS; PROCESSING CONDITIONS; SI SUBSTRATES; SI WAFERS; SINGLE LAYER; SINGLE LAYERS; THIN LAYERS; X-RAY DIFFRACTIONS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0003004725     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.300721     Document Type: Conference Paper

References (2)

1. Zhang Su ying "A high refractive index coating material - The preparation of Pb1-xGexTe crystal" at al SPIE 1519 pp 508-513 1991.
2. Fen Wei-Tin "A simple method for deter mination of N.K.D. of coating and its application in low temperature measures", China J. Infrared & Millimeter waves vol. 9 no. 1 pp. 25-30(1990).