Composition effects on structural and optical infrared properties of CuIn0.5Ga0.5Se2

Journal of Applied Physics

Volumn 88, Issue 4, 2000, Pages 1776-1783

  Diaz R ^a   Martin T ^a   Merino, J M ^a   Leon M ^a   Martin De Vidales J L ^a   Rueda, F ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002946819     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1303063     Document Type: Article

References (24)

1. S. Endo, T. Irie, and H. Nakanishi, Sol. Cells 16, 1 (1986).
2. M. León, R. Díaz, and F. Rueda, J. Vac. Sci. Technol. A 12, 3082 (1994).
3. J. Hedstrom, H. Olsen, M. Bodegard, A. Kylner, L. Stolt, O. Harikim, M. Ruckh, and H. W. Schock, Proceedings of the 23rd IEEE Photov. Spec. Conference, Louisville, 1993, p. 364.
4. J. R. Tuttle et al., Mater. Res. Soc. Symp. Proc. 426, 143 (1996).
5. L. L. Kazmerski and K. A. Emery, Proceedings of the 2nd World Renewable Energy Congress, September 1992, UK, Vol. 1.
6. J. F. Guillemoles, P. Cowache, L. Thouin, L. Robbiola, R. Díaz, H. Hallak, D. Lincot, and J. Vedel, Cryst. Res. Technol. 31, 509 (1996).
7. R. Nouti, R. Axton, C. Herrington, and S. K. Deb, Appl. Phys. Lett. 45, 668 (1984).
8. S. B. Zhang, S. H. Wei, and A. Zunger, Phys. Rev. Lett. 78, 4059 (1997).
9. S. H. Wei, S. B. Zhang, and A. Zunger, Inst. Phys. Conf. Ser. 152, 765 (1997).
10. J. M. Merino, J. L. Martín de Vidales, S. Mahanty, R. Díaz, F. Rueda, and M. León, J. Appl. Phys. 80, 5610 (1996).
11. T. Martín, J. M. Merino, J. L. Martín de Vidales, M. León, F. Rueda, and R. Diaz, Adv. Mater. Opt. Electron. 8, 147 (1998).
12. T. Martín, J. M. Merino, M. León, F. Rueda, and R. Diaz, J. Vac. Sci. Technol. (submitted).
13. I. V. Bodnar, A. G. Karoza, and G. F. Smirnova, Phys. Status Solidi B 84, K65 (1977).
14. A. M. Andriesh, N. N. Syrbu, M. S. Iovu, and V. E. Tazlavan, Phys. Status Solidi B 187, 83 (1995).
15. I. V. Bodnar, G. F. Smirnova, T. V. Smirnova, Y. A. Aleschenko, and C. K. Vodopyanov, Phys. Status Solidi B 145, 117 (1988).
16. H. Neumann, Helv. Phys. Acta 58, 337 (1985).
17. H. Neumann, Sol. Cells 16, 339 (1986).
18. Z. A. Shukri, C. H. Champness, and I. Shih, J. Cryst. Growth 129, 107 (1993).
19. A. Sakthivel and R. A. Young, User Guide to Programs DWB-9006 and DWBS-9006PC for Rietveld Analysis of X-Ray and Neutron Powder Diffraction Patterns. School of Physics, Georgia Institute of Technology, Atlanta, 1991.
20. The Rietveld Method, edited by R. A. Young (International Union of Crystallographers, Oxford University Press, Oxford, 1993), p. 298.
21. M. León and J. L. Martín de Vidales, in Handbook of Avanced Materials Testing, edited by N. P. Cheremisinoff and P. N. Cheremisinoff (Marcel Dekker, New York, 1995), p. 277.
22. I. V. Bodnar et al., Termchim. Acta 93, 685 (1985).
23. C. Durante Villamedia, Barcelona, 1998.
24. J. E. Jaffe and A. Zunger, Phys. Rev. B 29, 1882 (1984).