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Volumn 37, Issue 1, 1988, Pages 98-105

I-V characteristics of coupled ultrasmall-capacitance normal tunnel junctions

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0002920630     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.37.98     Document Type: Article
Times cited : (177)

References (26)
  • 1
    • 84931496379 scopus 로고    scopus 로고
    • Electron-Beam Lithography in Microelectronic Fabrication, edited by B. R. Brewer (Academic, New York, 1980); The Physics of Submicron Structures, edited by H. L. Gaubin, K. Hess, G. J. Iafrate, and D. K. Ferry (Plenum, New York, 1982).
  • 2
    • 84931496378 scopus 로고    scopus 로고
    • Y. Imry, in The Memorial Volume in Honor of Professor Shang-Keng Ma, edited by G. Grinstein and G. Mazenko (World-Scientific, Singapore, in press); E. Ben-Jacob, M. Buttiker, and R. A. Webb, Phys. Today (to be published).
  • 22
    • 84931496370 scopus 로고    scopus 로고
    • E. Ben-Jacob, R. C. Jaklevic, K. Mullen, and Z. Schuss (unpublished); K. Mullen and E. Ben-Jacob, Phys. Rev. Lett. (to be published).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.