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Volumn 352, Issue 1-2, 1999, Pages 91-96

Thermal characterization of thin superconducting films by modulated thermoreflectance microscopy

Author keywords

Modulated thermoreflectance microscopy; Thermal anisotropy; Thermal boundary resistance; Thermal diffusivity; Thin YBaCuO films

Indexed keywords


EID: 0002888311     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00360-0     Document Type: Article
Times cited : (28)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.