Detection of edges in analytical images using wavelet maxima

Journal of Trace and Microprobe Techniques

Volumn 18, Issue 1, 2000, Pages 1-14

  Wolkenstein, M ^a   Kolber, T ^a   Nikolov, S ^a   Hutter, H ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Multiresolution analysis; Secondary ion mass spectrometry; Wavelet edge detection; Wavelets

Indexed keywords

EID: 0002864658     PISSN: 07334680     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

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