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Volumn 106, Issue 1-4, 1995, Pages 43-46
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Defect production by MeV cluster impacts
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0002859211
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-583X(95)00675-3 Document Type: Article |
Times cited : (25)
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References (8)
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