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Volumn 7, Issue 1, 1998, Pages 51-66

Application of multivariate analysis for software fault prediction

Author keywords

Empirical study; Fault prone modules; Multivariate analysis; Prediction; Software design metrics

Indexed keywords

APPLICATION PROGRAMS; COMPUTER SOFTWARE SELECTION AND EVALUATION; DISCRIMINANT ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; FORECASTING; MULTIVARIANT ANALYSIS; PRINCIPAL COMPONENT ANALYSIS; PROJECT MANAGEMENT; SOFTWARE DESIGN;

EID: 0002848467     PISSN: 09639314     EISSN: 15731367     Source Type: Journal    
DOI: 10.1023/b:sqjo.0000042059.16470.f0     Document Type: Article
Times cited : (63)

References (13)
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    • The evaluation of software system's structure using quantitative software metrics
    • S. Henry and D. Kafura. The evaluation of software system's structure using quantitative software metrics, Software-Practice and Experience, 14(6), (1984) 561-573.
    • (1984) Software-Practice and Experience , vol.14 , Issue.6 , pp. 561-573
    • Henry, S.1    Kafura, D.2
  • 5
    • 1842761275 scopus 로고
    • Metrics and models for predicting software defects
    • Centre for Software Reliability, City University, London
    • N.E. Fenton, M. Neil and G. Ostrolenk. Metrics and models for predicting software defects. Technical Report CSR/10/02, Centre for Software Reliability, City University, London, 1995.
    • (1995) Technical Report CSR/10/02
    • Fenton, N.E.1    Neil, M.2    Ostrolenk, G.3
  • 6
  • 8
    • 33646161505 scopus 로고    scopus 로고
    • Predicting fault-prone software modules in telephone switches
    • N. Ohlsson and H. Alberg. Predicting fault-prone software modules in telephone switches, IEEE Transactions on Software Engineering, 22(12), (1996) 886-894.
    • (1996) IEEE Transactions on Software Engineering , vol.22 , Issue.12 , pp. 886-894
    • Ohlsson, N.1    Alberg, H.2
  • 13
    • 0002840269 scopus 로고
    • Industrial software metrics top 10 list
    • B. Boehm. Industrial software metrics top 10 list, IEEE Software, 4(5), (1987) 84-85.
    • (1987) IEEE Software , vol.4 , Issue.5 , pp. 84-85
    • Boehm, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.