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Volumn 87, Issue 1, 2000, Pages 78-85

Phase formation due to high dose aluminum implantation into silicon carbide

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0002810345     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371829     Document Type: Article
Times cited : (21)

References (32)
  • 5
    • 0003343627 scopus 로고
    • Properties of silicon carbide
    • INSPEC, London
    • Properties of Silicon Carbide, edited by G. L. Harris, EMIS DATAREVIEWS Series No. 13 (INSPEC, London, 1995), p. 154.
    • (1995) EMIS DATAREVIEWS Series , vol.13 , pp. 154
    • Harris, G.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.