Structural correlations in GexSe1-x glasses - A neutron diffraction study

Journal of Non-Crystalline Solids

Volumn 240, Issue 1-3, 1998, Pages 221-231

  Ramesh Rao, N ^a   Krishna, P S R ^b   Basu, S ^b   Dasannacharya, B A ^b,d   Sangunni, K S ^a   Gopal, E S R ^c  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b BHABHA ATOMIC RESEARCH CENTRE   (India)

^c NATIONAL PHYSICAL LABORATORY   (India)

^d UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CORRELATION METHODS; MOLECULAR STRUCTURE; MONTE CARLO METHODS; NEUTRON DIFFRACTION; SEMICONDUCTING GERMANIUM; SEMICONDUCTING GERMANIUM COMPOUNDS;

FIRST SHARP DIFFRACTION PEAK (FSDP);

SEMICONDUCTING GLASS;

EID: 0002806543     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(98)00705-4     Document Type: Article

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