Decomposition of methane on polycrystalline thick films of Ga2O3 investigated by thermal desorption spectroscopy with a mass spectrometer

Fresenius' Journal of Analytical Chemistry

Volumn 358, Issue 1-2, 1997, Pages 187-189

  Becker, F ^a   Krummel, Ch ^a   Freiling, A ^a   Fleischer, M ^b   Kohl, C ^a  

^a JUSTUS LIEBIG UNIVERSITY   (Germany)

^b SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002785543     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050379     Document Type: Article

References (7)

1. Krummel C, Freiling A, Schmidt R, Kelleter J, Wollnik H, Kohl C (1995) Fresenius' J Anal Chem 353: 521-523
2. Fleischer M, Meixner H (1993) J Appl Phys 74: 1993
3. Fleischer M, Meixner H (1991) Sensors and Actuators B, 4: 437
4. Fleischer M, Giber J, Meixner H (1992) Applied Physics A 54: 560-566
5. Bozon-Verduraz F (1970) Chim Phys et Phys Biol 67: 1608
6. Tamaru K (1978) Dynamic Heterogenous Catalysis, Academic Press, London
7. Fleischer M, Meixner H (1995) Sensors and Actuators, B 26: 85-88