Partner SRLs for improved shift register diagnostics

Proceedings of the IEEE VLSI Test Symposium

Volumn 1992-April, Issue , 1992, Pages 198-201

  Schafer, J L ^a   Policastri, F A ^a   McNulty, R J ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

VLSI CIRCUITS;

LOW OVERHEAD;

SHIFT REGISTERS;

EID: 0002782887     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.1992.232749     Document Type: Conference Paper

References (1)

1. E. B. Eichelberger and T. W. Williams, "A Logic Design Structure for LSI Testability", 14th Design Automation Conference Proceedings, pp. 462-468, June 20-22, 1977, New Orleans, La.