Capture cross sections of electron irradiation induced defects in 6H-SiC

Journal of Applied Physics

Volumn 84, Issue 2, 1998, Pages 704-708

  Hemmingsson, C ^a   Son, N T ^a   Kordina, O ^a,c   Janzen E ^a   Lindstrom J L ^b  

^a LINKÖPING UNIVERSITY   (Sweden)

^b SWEDISH DEFENCE RESEARCH AGENCY   (Sweden)

^c Arkansas Power Electronics International Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002771219     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368125     Document Type: Article

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