(3,7-Diethyl-3,7-diazanonane-1,9-dithiolatoS,N,N′,S′)nickel( II)

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 55, Issue 3, 1999, Pages 328-330

  Schneider, Jörg ^a   Hauptmann, Ralf ^a   Osterloh, Frank ^b   Henkel, Gerald ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002754402     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198012578     Document Type: Article

References (13)

1. Cammack, R. (1988). Adv. Inorg. Chem. 32, 297-333.
2. Colpas, G. J., Kumar, M., Day, R. O. & Maroney, M. J. (1990). Inorg. Chem. 29, 4779-4788.
3. Darensbourg, M. Y., Tuntulani, T. & Reibenspies, J. H. (1995). Inorg. Chem. 34, 6287-6294.
4. Drew, M. G. B., Rice, D. A. & Richards, K. M. (1980). J. Chem. Soc. Datlon Trans. pp. 2075-2080.
5. Mills, D. K., Reibenspies, J. H. & Darensbourg, M. Y. (1990). Inorg. Chem. 29, 4366-4368.
6. Musie, G., Farmer, P. J., Tuntulani, T., Reibenspies, J. H. & Darensbourg, M. Y. (1996). Inorg. Chem. 35, 2176-2183.
7. Osterloh, F. (1997). PhD thesis, University of Oldenburg, Germany.
8. Osterloh, F., Saak, W., Haase, D. & Pohl, S. (1996). J. Chem. Soc. Chem. Commun. pp. 777-778.
9. Schneider, J. (1997). Diploma thesis, University of Oldenburg, Germany.
10. Sheldrick, G. M. (1990). SHELXTL-Plus. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
11. Sheldrick, G. M. (1993). SHELXL91. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
12. Siemens (1991). P3 Diffractometer Control Program. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
13. Tuntulani, T., Reibenspies, J. H., Farmer, P. J. & Darensbourg, M. Y. (1992). Inorg. Chem. 31, 3497-3499.