Estimation of parameters for the truncated exponential distribution

Communications in Statistics - Theory and Methods

Volumn 28, Issue 11, 1999, Pages 2591-2612

  Hannon, Patrick M ^a   Dahiya, Ram C ^a  

^a OLD DOMINION UNIVERSITY   (United States)

Author keywords

Increasing failure rate; Maximum likelihood; Point estimation; Survival modeling

Indexed keywords

EID: 0002712598     PISSN: 03610926     EISSN: None     Source Type: Journal    
DOI: 10.1080/03610929908832440     Document Type: Article

References (14)

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