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Volumn 60, Issue 3, 1999, Pages 2018-2033

[Formula Presented] and [Formula Presented] x-ray emission spectra of metallic scandium

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0002709591     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.60.2018     Document Type: Article
Times cited : (43)

References (61)
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    • I.I. Tupitsyn, L.L. Makarov, and J.F. Batrakov, J. Phys. Chem. Solids 59, 809 (1998);F.M.F. de Groot, in Raman Emission by X-Ray Scattering edited by D.L. Ederer and J.H. McGuire (World Scientific, Singapore, 1996).
    • (1998) J. Phys. Chem. Solids , vol.59 , pp. 809
    • Tupitsyn, I.I.1    Makarov, L.L.2    Batrakov, J.F.3
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    • M.A. Blokhin, in Advances in X-ray Spectroscopy, edited by C. Bonnelle and C. Mandé (Pergamon, Oxford, 1982), pp. 90–103
    • M.A. Blokhin, in Advances in X-ray Spectroscopy, edited by C. Bonnelle and C. Mandé (Pergamon, Oxford, 1982), pp. 90–103.
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    • The standard deviations (SD’s), given in brackets after each value in the tables, were obtained in one of two ways. For values extracted directly from the fit the associated SD’s are those evaluated via standard error analysis. When the value cited is a derived quantity X, requiring additional calculations based on the parameters of the fitted curves, a program, written in-house, repeats the required calculation 100 times, varying all relevant parameters randomly within their standard deviations (normally distributed values, with a width equal to the SD of that particular value). From each calculation the derived quantity X is determined. We then calculate the mean and standard deviation of the 100 values of X. The mean and SD are then listed in the table as the value and its error. For example, the (Formula presented) listed for (Formula presented) in the line denoted “Run I” in Table II was calculated by computing 100 times the sum of the six VF’s, using the parameters listed in Table I. In each calculation the value of each parameter was chosen randomly within the range permitted by the SD of that parameter, as listed in brackets in Table I. For each sum, the FWHM of (Formula presented) was determined. The mean of the 100 values was calculated to be 1.332, and the SD from the mean was 0.016
    • The standard deviations (SD’s), given in brackets after each value in the tables, were obtained in one of two ways. For values extracted directly from the fit the associated SD’s are those evaluated via standard error analysis. When the value cited is a derived quantity X, requiring additional calculations based on the parameters of the fitted curves, a program, written in-house, repeats the required calculation 100 times, varying all relevant parameters randomly within their standard deviations (normally distributed values, with a width equal to the SD of that particular value). From each calculation the derived quantity X is determined. We then calculate the mean and standard deviation of the 100 values of X. The mean and SD are then listed in the table as the value and its error. For example, the (Formula presented) listed for (Formula presented) in the line denoted “Run I” in Table II was calculated by computing 100 times the sum of the six VF’s, using the parameters listed in Table I. In each calculation the value of each parameter was chosen randomly within the range permitted by the SD of that parameter, as listed in brackets in Table I. For each sum, the FWHM of (Formula presented) was determined. The mean of the 100 values was calculated to be 1.332, and the SD from the mean was 0.016.
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    • S.T. Perkins, D.E. Cullen, M.H. Chen, J.H. Hubbell, J. Rathkopf, and J. Scofield, Lawrence Livermore National Laboratory, Evaluated Atomic Data Library (EADL) (Formula presented) Report No. UCRL-50400, 1991
    • S.T. Perkins, D.E. Cullen, M.H. Chen, J.H. Hubbell, J. Rathkopf, and J. Scofield, Lawrence Livermore National Laboratory, Evaluated Atomic Data Library (EADL) (Formula presented) Report No. UCRL-50400, 1991.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.