X-ray diffraction and ion backscattering study of thermally annealed Pd/SiC and Ni/SiC

Journal of Applied Physics

Volumn 57, Issue 2, 1985, Pages 618-619

  Pai, C S ^a   Hanson, C M ^a   Lau, S S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002677573     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.334749     Document Type: Article

References (8)